StarVision® PRO represents the state-of-the-art in debug solutions for advanced electronic SoCs. The incorporation of Concept’s leading visualization and detection technology enables rapid cause-effect analysis for efficient functional analysis. This advanced and unique mixed-mode debug platform seamlessly combines SPICE and transistor analysis from our market leading SpiceVision PRO tool with digital RTL and gates from our advanced RTLvision PRO tool. It is fully customizable and incorporates many advanced features not available in other debug solutions, to handle the most complex of SoC platforms.